Test & measurement se wireline test (LAN, DSL, cable) integrated circuits and reference designsintegrated circuits and reference designs

Wide bandwidth, high dynamic range frontend with low-noise clock is critical for analyzing the amplitude and timing of the LAN/WAN signals. Our integrated circuits and reference designs help you design high-performance data acquisition and arbitrary waveform generation frontend for LAN/WAN test equipment.

High-performing LAN / WAN test equipment often requires:

• High-speed data converters that help with timing and noise margin measurement
• Low-phase noise clocks for improved timing margins and jitter measurements
• Efficient power supply that minimizes board area and improves thermal performance
• Low EMI power architecture that improves system sensitivity and dynamic range